Work

Re-Examination of Uniaxial Stress Effects in Ultra-Scaled GAAFETs

Year: 2025

Type: conference-paper

Source: IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

DOI: 10.1109/edtm61175.2025.11041377

Authors: Yusi Zhao, Huawei Tang, Rongzheng Ding, Yudong Lv, Yanbo Tang, Shaofeng Yu

Institution: Fudan University

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411799452

FWCI:

Cites: 7

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Related to: 10