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Competing Ferroelectric Polarization and Defect Migration Induced Resistive Switching in Van Der Waals β-In2Se3

Year: 2025

Type: conference-paper

Source: IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

DOI: 10.1109/edtm61175.2025.11040523

Authors: Yinfeng Long, Saiyu Bu, Han Chen, Kai Liu, Shiyu Zhang, Lin Wang

Institutions: Shanghai Jiao Tong University, Peking University

Language: English

Topic: Advanced Memory and Neural Computing

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

Award: G7200260368

OpenAlex ID: W4411799461

FWCI:

Cites: 9

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Related to: 10