Work

Reliability-Aware Device and Programming Scheme Optimization for PBS/NBS-Immune IGZO-Based 2T0C DRAM

Year: 2025

Type: conference-paper

Source: IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

DOI: 10.1109/edtm61175.2025.11041319

Authors: Zhidong Tang, Yanbo Su, Jianshi Tang, Yijia Fan, Yiwei Du, Mingcheng Shi, Yibei Zhang, Dong Wu, Bin Gao, He Qian, Huaqiang Wu

Institution: Tsinghua University

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funder: National Natural Science Foundation of China

Award: G1368963711

OpenAlex ID: W4411799665

FWCI:

Cites: 1

Cited by:

Related to: 10