Work

Establishment of measurement traceability of dielectric-constant measurement using contact and non-contact methods

Year: 2025

Type: article

Abstract: To meet industry demands, measurement traceability for the dielectric constant of solid reference materials has been established at audio and radio frequencies. The dielectric constant is determined using capacitance-based contact and non-contact methods, where the dielectric material is sandwiched between the electrodes of a dielectric test fixture. A precision LCR meter measures the capacitance of solid dielectric materials, and results from contact and non-contact methods align well up to 1 MHz. Measurement uncertainty is evaluated according to the Guide to the Expression of Uncertainty in Measurement, with a detailed discussion of contributing factors.

Source: ACTA IMEKO

DOI: 10.21014/actaimeko.v14i2.1739

Authors: S. Satish, Rajendra Meena, Reva Singh, Priyanka Jain, Joges C. Biswas

Institutions: Council of Scientific and Industrial Research, CSIR National Physical Laboratory of India, Delhi Technological University

Language: English

Topic: Microwave and Dielectric Measurement Techniques

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: diamond

Funder: National Physical Laboratory

OpenAlex ID: W4411814552

FWCI: 0.693

Cites:

Cited by: 3

Related to: 10