Enhanced crystallization and dielectric properties of atomic layer deposited SrTiO 3 thin films on Ru electrode by inserting GeO 2 interfacial layer
Year: 2025
Type: article
Source: Materials Horizons
DOI: 10.1039/d5mh00611b
Authors: Heewon Paik, Junil Lim, Haengha Seo, Tae Kyun Kim, Jonghoon Shin, Haewon Song, Dong Gun Kim, Woongkyu Lee, Dae Seon Kwon, Cheol Seong Hwang
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Award: G7208142174
OpenAlex ID: W4411823384
