Work

Conformality limits of 2D WS 2 on 3D nanostructures

Year: 2025

Type: article

Abstract: 3D nanostructures are investigated through cross-sectional transmission electron microscopy imaging. A minimum radius of curvature of 4 nm is identified above which basal plane conformality is almost always observed, while for smaller radii conformality is only observed in approximately half of the cases. We show that the observed tipping point agrees with the balance between the adhesion and stiffness forces, which allows for the estimation of the critical radius of curvature for other 2D TMDs and substrates. These results provide guidelines for the design of 3D nanostructured devices and substrates on which conformality of 2D materials is desired.

Source: Nanoscale

DOI: 10.1039/d5nr01013f

Authors: Jeff J. P. M. Schulpen, Saravana B. Basuvalingam, Marcel A. Verheijen, Ageeth A. Bol

Institutions: Eindhoven University of Technology, Eurofins (Netherlands), University of Michigan

Language: English

Topic: 2D Materials and Applications

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: hybrid

Funders: Nederlandse Organisatie voor Wetenschappelijk Onderzoek, Provincie Noord-Brabant

Award: G3785436846