First x-rays from a compact and tunable LINAC-based Compton scattering source
Year: 2025
Type: article
Abstract: In this paper, we present the first measurements of x-rays produced with a compact, narrowband, and tunable inverse Compton scattering-based x-ray source, developed at Eindhoven University of Technology. A flux of 1.2 · 10 3 photons per shot was measured, in agreement with simulations. Using a high-resolution spectral camera, we show that the photon energy can be tuned continuously from 5.8 keV to 10.7 keV with a bandwidth of 4%. The measured rms x-ray pulse length had an upper bound of 2.8 ps. Additionally, we show that the source allows full control over the x-ray polarization. The current average brilliance of the source is 10 5 photons/(s × mrad 2 × mm 2 × 0.1% BW). By optimizing experimental parameters, implementing improvements to the setup and further conditioning of the accelerator structure, a brilliance of 10 12 photons/(s × mrad 2 × mm 2 × 0.1% BW) can be achieved, with photon energies up to 40 keV. Because the complete electron beamline fits on a single three m-sized optical table, it is suitable as an in-house X-ray source for laboratories, industrial production lines, museums, and hospitals.
Source: Optics Express
DOI: 10.1364/oe.566542
Authors: I. J. M. Van Elk, C. W. Sweers, D. F. J. Nijhof, R. G. W. Van den Berg, T. G. Lucas, X. F. D. Stragier, P. Tack, M. N. Boone, O. J. Luiten, P. H. A. Mutsaers
Institutions: Eindhoven University of Technology, Ghent University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: gold
Estimated APC paid: $2,270
Awards: G7654443651, G7891867501
OpenAlex ID: W4411896863
