Contact line dynamics modulated by electrode roughness determines bubble detachment size
Year: 2025
Type: article
Source: Chemical Communications
DOI: 10.1039/d5cc02994e
Authors: Weikang Yang, Dongxu Gu, Xin Liu, Qiangmin Luo
Institutions: Chongqing University, Henan Academy of Sciences
Language: English
Subfield: Water Science and Technology
Field: Environmental Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4411905613