Work

ToF-SIMS and XPS coupled characterization of HgCdTe surface oxides for infrared detection applications

Year: 2025

Type: article

Source: Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena

DOI: 10.1116/6.0004626

Authors: Steven Bel, Clément Lobre, Sarah Petit, Marc Veillerot, Giacomo Badano, Philippe Ballet

Institutions: Commissariat à l'Énergie Atomique et aux Énergies Alternatives, CEA Grenoble, Laboratoire d'Électronique des Technologies de l'Information

Language: English

Topic: Advanced Semiconductor Detectors and Materials

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Agence Nationale de la Recherche

Award: PFNC equipements

OpenAlex ID: W4411929384

FWCI: 0.231

Cites: 23

Cited by: 1

Related to: 10