Work

High temperature accelerated degradation modelling and life span prediction of uni-traveling-carrier photodetectors based on Wiener process

Year: 2025

Type: article

Source: Physica Scripta

DOI: 10.1088/1402-4896/adeb0a

Authors: Yuebo Liu, Jianting Lu, Zesheng Lv, Yuanyuan Zhu, Hao Niu, Jiahui Yan

Institutions: China Electronic Product Reliability and Environmental Test Institute, Sun Yat-sen University, Shaanxi University of Science and Technology, South China University of Technology

Language: English

Topic: Reliability and Maintenance Optimization

Subfield: Safety, Risk, Reliability and Quality

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411940078

FWCI: 0.578

Cites: 26

Cited by: 1

Related to: 10