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Applying Machine Learning to Predict Software Defects

Year: 2024

Type: conference-paper

Source: International Conference on Advances in Computing, Communication and Materials (ICACCM)

DOI: 10.1109/icaccm61117.2024.11059225

Authors: Samruddhi Bhaskar Mohite, Pallavi Semwal, John Anand, Madan Mohan Sati, Aniket Singh, Neha Tripathi

Institutions: Graphic Era Hill University, IIMT College of Engineering, Greater Noida, Uttarakhand Technical University, Graphic Era University

Language: English

Topic: Software Engineering Research

Subfield: Information Systems

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411949193

FWCI: 0.393

Cites: 21

Cited by: 1

Related to: 10