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AI-Enabled Quality Control: Detecting Defects in Manufacturing Processes with Convolutional Neural Networks

Year: 2024

Type: conference-paper

Source: International Conference on Advances in Computing, Communication and Materials (ICACCM)

DOI: 10.1109/icaccm61117.2024.11059119

Authors: S.Rajarajeswari, J Prasadarao, Myasar Mundher Adnan, Simranjit Kaur, Ravi Vishwakarma, R. Vinoth

Institutions: Aditya University, Islamic University of Najaf

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4411949260

FWCI:

Cites: 14

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Related to: 10