Hybrid Convolutional Neural Network with Transfer Learning and MobileNetV2 for Advanced Multi-Class PCB Defect Detection
Year: 2025
Type: conference-paper
Authors: Dajian Wan, Mideth B. Abisado
Institution: National University
Language: English
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4411996111