Work

Defect Detection of Photovoltaic Modules Based on Electroluminescence Images: A RCLM-YOLO Method

Year: 2025

Type: conference-paper

DOI: 10.1109/icaisisas64483.2025.11052184

Authors: Shili Guo, Mingchao Song, Ye Liu

Institutions: Shanghai University of Engineering Science, Beijing Institute of Control Engineering

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Affordable and clean energy

Open Access status: closed

OpenAlex ID: W4411996368

FWCI:

Cites: 21

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Related to: 10