Work

WHE-YOLO: A Lightweight PCB Surface Defect Detection Model Based on YOLOv8n

Year: 2024

Type: conference-paper

Source: International Conference on Automation, Control and Robots (ICACR)

DOI: 10.1109/icacr62205.2024.11053741

Authors: Junjie Chen, Juncheng Zou, Dafeng Long, Hongxiang Lin, Guangyu Yang

Institution: Huizhou University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4411996897

FWCI: 1.441

Cites: 19

Cited by: 2

Related to: 10