Comprehensive optical characterization of organic thin films for OLED applications via spectroscopic ellipsometry
Year: 2025
Type: article
Abstract: In this study, spectroscopic ellipsometry was employed to characterize the optical properties of 19 different organic thin films used in the fabrication of organic light-emitting diodes (OLEDs). The films were deposited via thermal evaporation onto quartz and soda lime float glass substrates coated with a SiO 2 buffer layer and indium tin oxide (ITO). The analysis included a range of organic compounds, from widely studied materials such as CBP (4,4′-Bis(N-carbazolyl)-1,1′-biphenyl) to less-explored compounds such as TAZ (3-(Biphenyl-4-yl)-5-(4-tert-butylphenyl)-4-phenyl-4H-1,2,4-triazole), PO-T2T ((1,3,5-Triazine-2,4,6-triyl)tris(benzene-3,1-diyl)tris(diphenylphosphine oxide)), CzSi (9-(4-tert-butylphenyl)-3,6-bis(triphenylsilyl)-9H-carbazole), and NBphen (2,9-Dinaphthalen-2-yl-4,7-diphenyl-1,10-phenanthroline). Attention was given to the influence of substrate material on the complex refractive index - specifically, the refractive index ( n ) and extinction coefficient ( k ) - across a broad spectral range (210-1690 nm, 0.7-5.9 eV). The results reveal critical insights into substrate-dependent variations, including the presence of refractive index gradients and anisotropic optical behavior in selected organic thin films.
Source: Optical Materials X
Institutions: Institute of Solid State Physics, UL, University of Latvia
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: gold
Estimated APC paid: $2,270
OpenAlex ID: W4412005151