Work

Correlative and In Situ Microscopy Investigation of Phase Transformation, Crystal Growth, and Degradation of Antimony Sulfide Thin Films

Year: 2025

Type: article

Source: ACS Nano

DOI: 10.1021/acsnano.5c04342

Authors: Mingjian Wu, Maïssa K. S. Barr, Vanessa M. Koch, Martin Dierner, Tobias Dierke, Penghan Lu, Pei-Chun Liao, Johannes Will, Rafal E. Dunin-Borkowski, Janina Maultzsch, Julien Bachmann, Erdmann Spiecker

Institutions: Friedrich-Alexander-Universität Erlangen-Nürnberg, Forschungszentrum Jülich, Ernst Ruska Centre

Language: English

Topic: Chalcogenide Semiconductor Thin Films

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Deutsche Forschungsgemeinschaft

Awards: G1386772601, RamanMikroskop für spitzenverstärkte Ramanstreuung (TERS), G967606689

OpenAlex ID: W4412035720

FWCI: 1.847

Cites: 43

Cited by: 8

Related to: 10