Polarization Reconstruction Based on Monte Carlo Simulations for a Compton Polarimeter
Year: 2025
Type: article
Abstract: State-of-the-art 2D sensitive semiconductor detectors developed within the SPARC collaboration can be utilized as dedicated Compton polarimeters in the hard X-ray regime. We report on the technique of Compton polarimetry utilizing such a detector and present a method to determine the linear polarization of an analyzed hard X-ray beam by means of Monte-Carlo-simulated data sets.
Source: Atoms
Language: English
Subfield: Nuclear and High Energy Physics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: gold
Estimated APC paid: $1,810
OpenAlex ID: W4412040059
