Work

Coverage for Detecting Bias in Facial Recognition Datasets

Year: 2025

Type: conference-paper

Source: IEEE Conference on Artificial Intelligence (CAI)

DOI: 10.1109/cai64502.2025.00047

Authors: Sakshi Mhatre, Brian Lee, Erin Lanus, Laura J. Freeman

Institution: Virginia Tech

Language: English

Topic: Ethics and Social Impacts of AI

Subfield: Safety Research

Field: Social Sciences

Domain: Social Sciences

SDG: Reduced inequalities

Open Access status: closed

OpenAlex ID: W4412082424

FWCI: 2.087

Cites: 21

Cited by: 2

Related to: 10