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Metric Learning-Based Incorrect Component Detection Framework

Year: 2025

Type: conference-paper

Source: IEEE Conference on Artificial Intelligence (CAI)

DOI: 10.1109/cai64502.2025.00010

Authors: Chia-Yu Lin, Yu-Chiao Kuo, Sheng-Che Lin, Ted T. Kuo

Institutions: National Central University, Yuan Ze University, Korea University, National Yang Ming Chiao Tung University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4412082774

FWCI:

Cites: 15

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Related to: 10