Dual-Pin Impedance Probe for Crop Quality Estimation Using the RF Return Loss Method
Year: 2024
Type: conference-paper
Author: Temitope Odedeyi
Institution: University College London
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
SDG: Zero hunger
Open Access status: closed
Funders: Royal Academy of Engineering, Cordis
Award: G7732351668
OpenAlex ID: W4412127964