Work

Methodology and Test Structures for Studying β-Ga2O3 Dielectric and Contact Interfaces

Year: 2025

Type: conference-paper

Source: IEEE International Conference on Microelectronic Test Structures (ICMTS)

DOI: 10.1109/icmts63811.2025.11068900

Authors: A. A. Gruszecki, J. Roy, K. S. Agrawal, P. La Torraca, K. Cherkaoui, P. K. Hurley, R. M. Wallace, C. D. Young

Institutions: The University of Texas at Dallas, University College Cork, Tyndall National Institute

Language: English

Topic: Ga2O3 and related materials

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4412129691

FWCI: 9.986

Cites: 12

Cited by: 2

Related to: 10