Work

Power switch improvement for RO array characterization in 18nm FD-SOI technology platform validation

Year: 2025

Type: conference-paper

Source: IEEE International Conference on Microelectronic Test Structures (ICMTS)

DOI: 10.1109/icmts63811.2025.11068914

Authors: C. Cagli, F. Pourchon, H. Degoirat, J. B. Moulard, F. Granoux, M. Dahmani, R. Wilson

Institution: STMicroelectronics (France)

Language: English

Topic: Low-power high-performance VLSI design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4412129735

FWCI: 2.358

Cites: 3

Cited by: 1

Related to: 10