Work

Oscillation in Cryogenic DC Measurements of High Power LDMOS Devices and Solution

Year: 2025

Type: conference-paper

Source: IEEE International Conference on Microelectronic Test Structures (ICMTS)

DOI: 10.1109/icmts63811.2025.11068933

Authors: Yili Wang, Kejun Xia, Guofu Niu, Michael Hamilton, Xu Cheng

Institutions: Auburn University, Taiwan Semiconductor Manufacturing Company (Taiwan), NXP (Germany)

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4412129791

FWCI:

Cites: 6

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Related to: 10