Work

A Test Structure for Analyzing Self-Heating Induced Distortion in On-Chip Current Sensing Resistors

Year: 2025

Type: conference-paper

Source: IEEE International Conference on Microelectronic Test Structures (ICMTS)

DOI: 10.1109/icmts63811.2025.11068913

Authors: Heng Ma, Shoubhik Karmakar, Huajun Zhang, Yuyan Liu, Haidong Guo, Marco Berkhout, Qinwen Fan

Institution: Delft University of Technology

Language: English

Topic: Analog and Mixed-Signal Circuit Design

Subfield: Biomedical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4412129840

FWCI: 2.791

Cites: 12

Cited by: 1

Related to: 10