Work

SiC DMOSFET Real Wafer Level HTRB and HTGB Evaluation

Year: 2025

Type: conference-paper

Source: IEEE International Conference on Microelectronic Test Structures (ICMTS)

DOI: 10.1109/icmts63811.2025.11068904

Authors: Ng Hong Seng, Tan Ai Heong, Beh Shun Xiar, Lee Johnny, Lin Jia Wei

Institution: X-Fab (United States)

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4412130046

FWCI:

Cites: 9

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Related to: 10