Work

Active Sampling of Electrical Characterization Parameters for Efficient Measurement

Year: 2025

Type: conference-paper

Source: IEEE International Conference on Microelectronic Test Structures (ICMTS)

DOI: 10.1109/icmts63811.2025.11068930

Authors: Husnu Murat Kocak, Jerome Mitard, Ahmet Teoman Naskali, Jesse Davis

Institutions: KU Leuven, IMEC, Galatasaray University

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: HORIZON EUROPE Framework Programme

OpenAlex ID: W4412130056

FWCI: 4.536

Cites: 9

Cited by: 2

Related to: 10