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Fault-tolerant control subject to Markov fault model: Direct data-driven strategy

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Year: 2025
Type: conference-paper
DOI: 10.1109/ddcls66240.2025.11066039
Authors: Ning Zhang, Yugang Niu, Bei Chen
Institutions: East China University of Science and Technology, Key Laboratory of Smart Manufacturing in Energy Chemical Process, Ministry of Education, Shanghai University of Engineering Science
Language: English

Topic: Fault Detection and Control Systems
Subfield: Control and Systems Engineering
Field: Engineering
Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China
OpenAlex ID: W4412346187
FWCI:
Cites: 17
Cited by:
Related to: 10
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