Causal analysis enhanced stacked denoising autoencoder for closed-loop industrial process monitoring
Year: 2025
Type: conference-paper
Authors: Feng Gao, Yuting Li, Yinghao Zhao, Xu Yang, Jian Huang, Jingjing Gao
Institution: University of Science and Technology Beijing
Language: English
Subfield: Control and Systems Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4412353051
