Work

Pattern Matters: The Impact of Projection Patterns on Deep Learning 3-D Profilometry

Year: 2025

Type: article

Source: IEEE Transactions on Instrumentation and Measurement

DOI: 10.1109/tim.2025.3587365

Authors: Rhys G. Evans, Stef Bordo, Joris J. J. Dirckx, Sam Van der Jeught

Language: English

Topic: Optical measurement and interference techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4412375158

FWCI: 0.739

Cites: 44

Cited by: 2

Related to: 10