Squeeze-and-Excitation Integrated MobileNetV2 for Efficient DeepFake Detection
Year: 2025
Type: conference-paper
Authors: Kajal Tulshyan, Gautam Kumar
Institution: National Institute of Technology Delhi
Language: English
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4412405034
