Work

Aging Analysis of Various SRAM Cells Under Diverse Workload Condition

Year: 2025

Type: conference-paper

Source: IEEE International Conference on VLSI Systems, Architecture, Technology and Applications (VLSI SATA)

DOI: 10.1109/vlsisata65374.2025.11070124

Authors: Atul Ranjan Srivastava, Jani Babu Shaik, Sonal Singhal, Atul Vir Singh

Institution: Shanghai Jiao Tong University

Language: English

Topic: Low-power high-performance VLSI design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4412405365

FWCI:

Cites: 15

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Related to: 10