Work

A Large Language Model-Based Plagiarism Detection System Architecture for Academic Journals in Higher Education

Year: 2025

Type: conference-paper

DOI: 10.1109/icccs65393.2025.11069860

Authors: Feiyang Liu, Kewei You, Li Zhang, Li Zhang

Institution: University of Electronic Science and Technology of China

Language: English

Topic: Academic integrity and plagiarism

Subfield: Safety Research

Field: Social Sciences

Domain: Social Sciences

Open Access status: closed

OpenAlex ID: W4412405828

FWCI: 1.119

Cites: 4

Cited by: 1

Related to: 10