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A Dual Current Probe Method With Enhanced Low-Frequency Sensitivity for High-Voltage Dynamic Capacitance Measurement

Year: 2025

Type: article

Source: IEEE Transactions on Instrumentation and Measurement

DOI: 10.1109/tim.2025.3588979

Authors: Jaewon Rhee, Changmin Lee, Sanguk Lee, Seongho Woo, Yujun Shin, Seungyoung Ahn

Institutions: Korea Advanced Institute of Science and Technology, Keimyung University

Language: English

Topic: Advanced Electrical Measurement Techniques

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4412445391

FWCI:

Cites: 21

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Related to: 10