Work

Algorithm optimization of chip surface defect detection based on YOLOv7

Year: 2025

Type: conference-abstract

Source: International Conference on Image, Signal Processing and Pattern Recognition (ISPP)

DOI: 10.1117/12.3070723

Authors: Jian Zhang, Qiyu Yin

Institution: Northeastern University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4412478081

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