Work

SAC-YOLO11: a channel-pruned architecture for efficient tire defect detection in manufacturing

Year: 2025

Type: conference-paper

Source: International Conference on Image, Signal Processing and Pattern Recognition (ISPP)

DOI: 10.1117/12.3070638

Authors: Wenhua Jiao, Ruidong Tang, yifei you, Jinglong Chen, Guanglei Tan

Institution: China University of Mining and Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4412478357

FWCI: 2.526

Cites:

Cited by: 1

Related to: 10