Year: 2025
Type: article
Abstract: Conventional electrochemical experiments can only obtain the average contribution of all active sites in the catalyst. Hence, it is meaningful to distinguish the electrochemical contribution of the local active sites in single‐crystal catalysts. Here, a double‐hole patch clamp is designed to achieve a localized electrochemical measurement in a model catalyst, MoS2. The double‐hole patch clamp is further applied to measure the hydrogen evolution reaction of MoS2. By increasing the MoS2 thickness from monolayer to bilayer, the onset potential increases from 156 to 238 mV. There is no obvious electrocatalytic reaction by further increasing the MoS2 thickness to the trilayer. This could contribute to the ≈2.1 eV out‐of‐plane bandgap and corresponding high vertical resistance of MoS2. This double‐hole patch clamp provides a new tool to understand the electrocatalysis activities of the local active sites.
Source: ChemElectroChem
Authors: Zhipeng Zhang, Kuan Zhai, Junhong Chen, Junhong Chen, Chunhua Han, Yuehua Wen, Yuhang Chen, Yadi Zhou, Jiayi Chen, Jiayi Chen, Xiaobin Liao, Shumin Chen, Mengyu Yan
Language: English
Field: Energy
Domain: Physical Sciences
Open Access status: gold
Estimated APC paid: $2,750
OpenAlex ID: W4412516674