Ferroelectric polarization-driven ionic modulation enabling enhanced self-rectification in NiOx/HfO2−x: Al memristors
Year: 2025
Type: article
Source: Applied Physics Letters
DOI: 10.1063/5.0273610
Authors: Jiajing Wei, Yanfang He, Ying Yang, Huimin Zhang, Yufang Xie, Chenglin Zhang, Yuan Liu, Mingming Chen, Dawei Cao
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Awards: G1282684173, G1420427216
OpenAlex ID: W4412523832
