Measurement and Application of Soft-Field Effect in Electrical Tomography
Year: 2025
Type: article
Authors: Shenglu Yue, Shihong Yue, Ming Zeng
Institution: Tianjin University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Award: G5081601239
OpenAlex ID: W4412536790