Work

Modernization of the Hardness Tester Microscope from the MEI T-7 Device

Year: 2025

Type: conference-paper

Source: 2018Systems of Signal Synchronization, Generating and Processing in Telecommunications (SYNCHROINFO)

DOI: 10.1109/synchroinfo65403.2025.11079344

Authors: O. V. Pechinskaya, A. Yu. Marchenkov, G. B. Sviridov

Institution: Moscow Power Engineering Institute

Language: English

Topic: Advanced optical system design

Subfield: Biomedical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4412537635

FWCI:

Cites: 11

Cited by:

Related to: 10