CCEM key comparison CCEM.RF-K5c.CL
Year: 2025
Type: article
Abstract: Main text An international measurement comparison, identified as CCEM.RF-K5c.CL, for scattering parameters and reflection coefficients by broad-band method was conducted between twenty national metrology institutes. The purpose of the comparison is to establish the calibration measurement capability of each participating laboratory. This report presents the key comparison reference values and degree of equivalence of each participant with respect to the key comparison reference values of the comparison. The participants measured seven travelling standards, an adapter, a 20 dB attenuator, a 40 dB attenuator, two matched terminations, and two flush short terminations with 3.5 mm coaxial connectors from 0.1 GHz to 33 GHz. The pilot laboratory is National Metrology Institute of Japan (NMIJ) and the supporting laboratories are Federal Institute of Metrology (METAS) and National Physical Laboratory (NPL), National Institute of Metrology (NIM), and National Institute of Standards and Technology (NIST). Most of the reported measurement results were generally consistent, while there was a small number of outlying values. To reach the main text of this paper, click on Final Report . Note that this text is that which appears in Appendix B of the BIPM key comparison database https://www.bipm.org/kcdb/ . The final report has been peer-reviewed and approved for publication by the CCEM, according to the provisions of the CIPM Mutual Recognition Arrangement (CIPM MRA).
Source: Metrologia
Institutions: National Metrology Institute of Japan, Swiss Federal Institute of Metrology, National Physical Laboratory, Agency for Science, Technology and Research, Türkiye Bilimsel ve Teknolojik Araştırma Kurumu, Tübitak National Metrology Institute, National Metrology Institute of South Africa, National Academies of Sciences, Engineering, and Medicine, National Research Council, National Research Council Canada, Český metrologický institut, Central Office of Measures, Istituto Nazionale di Ricerca Metrologica, Physikalisch-Technische Bundesanstalt, VSL National Metrology Institute, Laboratoire National de Métrologie et d'Essais
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W4412554031