Work

Circuit Scan: PCB Error Detection using Microcontroller

Year: 2025

Type: conference-paper

DOI: 10.1109/amathe65477.2025.11081377

Authors: Neethan Elizabeth Abraham, Joseph Biju, Nandu Krishna, Navneeth Sunil Varrma

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4412560967

FWCI:

Cites: 10

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Related to: 10