Work

Nonuniformity Metrics for Coated Circular Substrates

Year: 2025

Type: conference-paper

DOI: 10.1364/oic.2025.wd.9

Authors: Eric Nybank, Adam Preuss, James C Switzer, Markus Kurt Tilsch

Institution: Viavi Solutions (United States)

Language: English

Topic: Surface Roughness and Optical Measurements

Subfield: Computational Mechanics

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4412566780

FWCI:

Cites: 3

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Related to: 10