Development of Refractive Index Control Technology for Optical Thin Films by a Combination of Sputtering and Electron Beam Evaporation
Year: 2025
Type: conference-paper
Authors: Naoya Tajima, Takayuki Matsudaira, Hiroshi Murotani
Institution: Tokai University
Language: English
Subfield: Surfaces, Coatings and Films
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4412566790
