Work

Development of Refractive Index Control Technology for Optical Thin Films by a Combination of Sputtering and Electron Beam Evaporation

Year: 2025
Type: conference-paper
Institution: Tokai University
Language: English
Open Access status: closed
OpenAlex ID: W4412566790
FWCI:
Cites: 2
Cited by:
Related to: 10