Optical and Durability Properties of Microwave Plasma Assisted Sputter Deposited Stoichiometric Silicon Nitride
Year: 2025
Type: conference-paper
Abstract: A study of the optical and mechanical properties of stoichiometric Silicon Nitride deposited using microwave plasma assisted sputtering. A coating stress of -317MPa, hardness of 1.3GPa was obtained with a transmittance range of 300nm-5μm.
Authors: Connor Lindsay, Carlos Garcia Nuñez, Lewis Fleming, Ian Brinkley, Stuart Reid, Iain Martin, Des Gibson
Language: English
Subfield: Mechanics of Materials
Field: Engineering
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W4412566846
