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Optical and Durability Properties of Microwave Plasma Assisted Sputter Deposited Stoichiometric Silicon Nitride

Year: 2025
Type: conference-paper
Abstract: A study of the optical and mechanical properties of stoichiometric Silicon Nitride deposited using microwave plasma assisted sputtering. A coating stress of -317MPa, hardness of 1.3GPa was obtained with a transmittance range of 300nm-5μm.
Language: English
Open Access status: green
OpenAlex ID: W4412566846
FWCI:
Cites: 10
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Related to: 10