Reliable Characterization of SK-1300, MgF2, ZnSe, and Si Substrates in 0.2-4.2 μm Spectral Range
Year: 2025
Type: conference-paper
Language: English
Subfield: Surfaces, Coatings and Films
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4412566853
