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Microprocessor Loadline Measurement Prediction Using Artificial Intelligence Regression

Year: 2025

Type: conference-paper

Source: IEEE Symposium on Computer Applications & Industrial Electronics (ISCAIE)

DOI: 10.1109/iscaie64985.2025.11080843

Authors: Sameer Shekhar, Simon Chun Kit See

Institutions: Intel (United States), Intel (Malaysia)

Language: English

Topic: Advanced DC-DC Converters

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4412567725

FWCI:

Cites: 9

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Related to: 10