Study and Performance Evaluation of SRAM Cells in 18nm FinFET Technology
Year: 2025
Type: conference-paper
Authors: Anuj Kaushik, Komal Gupta, Dhandapani Vaithiyanathan, Manish Verma, Preeti Verma, Baljit Kaur
Institution: National Institute of Technology Delhi
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4412568333