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Improved Yolov8 Algorithm for Detecting Industrial Defects on Aluminum Sheet

Year: 2025

Type: conference-paper

Source: International Conference on Computer Vision, Image and Deep Learning (CVIDL)

DOI: 10.1109/cvidl65390.2025.11085626

Authors: Qi Ou, Qiangren Wei, Si Zhong, Shijing Huang

Institution: Guilin University of Electronic Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4412623808

FWCI:

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