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A Spectral Similarity Measurement based on Piecewise Linear Representation

Year: 2025

Type: conference-paper

Source: International Conference on Computer Vision, Image and Deep Learning (CVIDL)

DOI: 10.1109/cvidl65390.2025.11085812

Authors: Yaxing Wei, Hongxiao Dong, Yan Li, Qingqing Wu, Bingzhen Li, Fangyuan Li

Institution: PLA Academy of Military Science

Language: English

Topic: Remote-Sensing Image Classification

Subfield: Media Technology

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4412623835

FWCI:

Cites: 26

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Related to: 10